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Published in 2017 at "Surface and Interface Analysis"
DOI: 10.1002/sia.6250
Abstract: X-ray photoelectron spectroscopy (XPS) was used in conjunction with gas cluster ion source etching to analyze polystyrene and polyvinylpyrrolidone multilayer samples, total thickness ~15 μm, to establish optimal conditions for depth profiles over many μm in…
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Keywords:
sample rotation;
gas cluster;
depth;
rotation ... See more keywords
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Published in 2020 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2020.145903
Abstract: Abstract The study of the chemical composition of buried interfaces by X-ray photoelectron spectroscopy (XPS) is limited by the inelastic mean free path of emitted photoelectrons (PE). Soft X-ray sources (AlKα) are generally suitable for…
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Keywords:
gas cluster;
gap;
ion beam;
xps ... See more keywords
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Published in 2020 at "Microelectronic Engineering"
DOI: 10.1016/j.mee.2020.111438
Abstract: Abstract Gas cluster cleaning is a method of dry cleaning avoiding the loss or damage of materials by forming aerosol clusters of tens to thousands of molecules via cooling and a pressure drops of a…
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Keywords:
gas;
surface;
cluster;
removal ... See more keywords
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Published in 2022 at "Biointerphases"
DOI: 10.1116/6.0001812
Abstract: Here, we present a study on agarose thin-film samples that represent a model system for the exopolysaccharide matrix of biofilms. Povidone-iodide (PVP-I) was selected as an antibacterial agent to evaluate our x-ray photoelectron spectroscopy (XPS)-based…
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Keywords:
argon gas;
gas cluster;
iodine;
xps ... See more keywords