The Impact of Gas Cluster Ion Beam Sputtering on the Chemical and Electronic Structure of Methyl Ammonium Lead Iodide Thin Films
Sign Up to like & getrecommendations! Published in 2025 at "Advanced Materials Interfaces"
DOI: 10.1002/admi.202500102
Abstract: The stability and performance of metal halide perovskite (MHP) optoelectronic devices are significantly influenced by the chemical and electronic properties of their interfaces, often studied using photoelectron spectroscopy (PES). MHP films, containing organic cations, are… read more here.
Keywords: gas cluster; cluster ion; lead; ion ... See more keywords
Sample rotation improves gas cluster sputter depth profiling of polymers
Sign Up to like & getrecommendations! Published in 2017 at "Surface and Interface Analysis"
DOI: 10.1002/sia.6250
Abstract: X-ray photoelectron spectroscopy (XPS) was used in conjunction with gas cluster ion source etching to analyze polystyrene and polyvinylpyrrolidone multilayer samples, total thickness ~15 μm, to establish optimal conditions for depth profiles over many μm in… read more here.
Keywords: sample rotation; gas cluster; depth; rotation ... See more keywords
GaP/Si(0 0 1) interface study by XPS in combination with Ar gas cluster ion beam sputtering
Sign Up to like & getrecommendations! Published in 2020 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2020.145903
Abstract: Abstract The study of the chemical composition of buried interfaces by X-ray photoelectron spectroscopy (XPS) is limited by the inelastic mean free path of emitted photoelectrons (PE). Soft X-ray sources (AlKα) are generally suitable for… read more here.
Keywords: gas cluster; gap; ion beam; xps ... See more keywords
Removal of nano-sized surface particles by CO2 gas cluster collisions for dry cleaning
Sign Up to like & getrecommendations! Published in 2020 at "Microelectronic Engineering"
DOI: 10.1016/j.mee.2020.111438
Abstract: Abstract Gas cluster cleaning is a method of dry cleaning avoiding the loss or damage of materials by forming aerosol clusters of tens to thousands of molecules via cooling and a pressure drops of a… read more here.
Keywords: gas; surface; cluster; removal ... See more keywords
XPS Depth-Profiling Studies of Chlorophyll Binding to Poly(cysteine methacrylate) Scaffolds in Pigment–Polymer Antenna Complexes Using a Gas Cluster Ion Source
Sign Up to like & getrecommendations! Published in 2024 at "Langmuir"
DOI: 10.1021/acs.langmuir.4c01361
Abstract: X-ray photoelectron spectroscopy (XPS) depth-profiling with an argon gas cluster ion source (GCIS) was used to characterize the spatial distribution of chlorophyll a (Chl) within a poly(cysteine methacrylate) (PCysMA) brush grown by surface-initiated atom-transfer radical… read more here.
Keywords: xps depth; gas cluster; depth; chl ... See more keywords
In-depth analysis of iodine in artificial biofilm model layers by variable excitation energy XPS and argon gas cluster ion sputtering XPS.
Sign Up to like & getrecommendations! Published in 2022 at "Biointerphases"
DOI: 10.1116/6.0001812
Abstract: Here, we present a study on agarose thin-film samples that represent a model system for the exopolysaccharide matrix of biofilms. Povidone-iodide (PVP-I) was selected as an antibacterial agent to evaluate our x-ray photoelectron spectroscopy (XPS)-based… read more here.
Keywords: argon gas; gas cluster; iodine; xps ... See more keywords