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1
Published in 2019 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2019.113488
Abstract: Abstract In this paper, we present a comprehensive analysis of the charge trapping mechanisms that affect the GaN based vertical Fin FETs when the devices are submitted to positive gate bias. Devices with higher channel…
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Keywords:
gate bias;
trapping mechanisms;
charge trapping;
gate ... See more keywords
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Published in 2020 at "ACS applied materials & interfaces"
DOI: 10.1021/acsami.0c17317
Abstract: Because of the excellent electrical properties, III-V semiconductor nanowires are promising building blocks for next-generation electronics; however, their rich surface states inevitably contribute large amounts of charge traps, leading to gate bias stress instability and…
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Keywords:
stress instability;
gate bias;
hysteresis;
bias stress ... See more keywords
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Published in 2025 at "Nanoscale"
DOI: 10.1039/d4nr04910a
Abstract: Two-dimensional (2D) organic-inorganic halide perovskites are promising sensitive materials for optoelectronic applications due to their strong light-matter interactions, layered structure, long carrier lifetime and diffusion length. However, a high gate bias is indispensable for perovskite-based…
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Keywords:
gate bias;
gate;
two dimensional;
zero gate ... See more keywords
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Published in 2024 at "Journal of Materials Chemistry A"
DOI: 10.1039/d4ta02276a
Abstract: Organic electrochemical transistors (OECTs) show great potential in next-generation bioelectronics due to their high transconductance, low driving voltage, and biocompatibility. These advantages rely on efficient electrochemical doping/dedoping of the transistor...
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Keywords:
gate bias;
towards organic;
organic electrochemical;
electrochemical transistors ... See more keywords
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1
Published in 2019 at "Semiconductor Science and Technology"
DOI: 10.1088/1361-6641/aafccc
Abstract: This paper presents a comparison between nMOS and pMOS Omega-Gate Nanowire for different channel width (W-NW) down to 10 nm as a function of the large back gate bias variation (from +20 to -20 V)…
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Keywords:
voltage;
back gate;
nmos pmos;
gate ... See more keywords
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1
Published in 2020 at "IEEE Transactions on Electron Devices"
DOI: 10.1109/ted.2020.3033516
Abstract: This study demonstrated that the edge effect induced by positive gate bias stress (PBS) was effectively eliminated by applying channel width extensions over source/drain regions in low-temperature polycrystalline silicon thin-film transistors (LTPS TFTs). After PBS,…
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Keywords:
extension;
effect induced;
channel width;
edge effect ... See more keywords
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Published in 2017 at "IEEE Transactions on Power Electronics"
DOI: 10.1109/tpel.2016.2636743
Abstract: The temperature dependence and stability of three different commercially-available unpackaged SiC Dmosfets have been measured. On-state resistances increased to 6 or 7 times their room temperature values at 350 °C. Threshold voltages almost doubled after…
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Keywords:
gate bias;
temperature;
high temperature;
power ... See more keywords
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Published in 2020 at "Semiconductors"
DOI: 10.1134/s1063782620020025
Abstract: Abstract A new quantitative model of the effect of the gate bias on the threshold voltage of metal-oxide-semiconductor (MOS) structures under ionizing irradiation is developed based on the consideration of hole trapping from the entire…
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Keywords:
gate bias;
model effect;
gate;
effect gate ... See more keywords
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2
Published in 2023 at "ECS Journal of Solid State Science and Technology"
DOI: 10.1149/2162-8777/acd1b4
Abstract: The threshold voltage (V TH) stability in GaN fat field-effect transistors (FATFETs) with a large channel area of ∼6.2 × 104 μm2 was studied using drain current vs gate voltage (I D–V G) characteristics. Each…
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Keywords:
gan fatfets;
bias induced;
threshold voltage;
voltage ... See more keywords
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2
Published in 2023 at "Micromachines"
DOI: 10.3390/mi14030576
Abstract: In this study, we report a low ohmic contact resistance process on a 650 V E-mode p-GaN gate HEMT structure. An amorphous silicon (a-Si) assisted layer was inserted in between the ohmic contact and GaN.…
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Keywords:
gate bias;
gan gate;
low thermal;
gate ... See more keywords
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Published in 2024 at "Micromachines"
DOI: 10.3390/mi15040496
Abstract: We investigated the effects of gate bias regarding the degradation of electrical characteristics during gamma irradiation. Moreover, we observed the punch through failure of 1.2 kV rated commercial Silicon Carbide (SiC) Metal Oxide Semiconductor Field…
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Keywords:
effects gate;
irradiation;
gate bias;
sic mosfets ... See more keywords