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Published in 2019 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2019.113426
Abstract: Abstract The non-uniform current sharing among the paralleled devices is consequential due to non-identical layout and alteration in parameters of the system consists of power semiconductor devices and gate drivers. The persistent non-uniform current among…
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Keywords:
delay compensation;
gate delay;
peak minimisation;
system ... See more keywords