Total Ionizing Dose Hardening Methodology in Back Gate Embedded SOI MOSFETs With Ultrathin Buried Oxide
Sign Up to like & getrecommendations! Published in 2025 at "IEEE Electron Device Letters"
DOI: 10.1109/led.2025.3587666
Abstract: A novel total ionizing dose (TID) hardening method is proposed based on the innovative back gate embedded silicon on insulator (BGESOI) technology. By elaborately designing the manufacturing process, the symmetric split gate configuration is constructed… read more here.
Keywords: methodology; back gate; gate embedded; ionizing dose ... See more keywords
An Intelligent Secure and Reliable Cloud Services Management Model With Toffoli Gate-Embedded Quantum Adam Neural Network
Sign Up to like & getrecommendations! Published in 2025 at "IEEE Transactions on Dependable and Secure Computing"
DOI: 10.1109/tdsc.2025.3588072
Abstract: The increasing dependence on cloud-based data processing for industrial applications, smart devices, and Cyber-Physical Systems (CPS) emphasizes the necessity to address the inherent vulnerabilities of multi-tenant cloud environments.The existing research have limited focus at the… read more here.
Keywords: gate embedded; secure; cloud; model ... See more keywords