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Published in 2022 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"
DOI: 10.1109/tcad.2021.3062767
Abstract: As a superset of cell-aware faults, gate-exhaustive faults provide a target for the generation of a comprehensive test set. Considering two-cycle gate-exhaustive faults, the number of faults can be excessive, and many of the faults…
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Keywords:
gate exhaustive;
cycle gate;
exhaustive faults;
two cycle ... See more keywords