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Published in 2017 at "Advances in Electrical and Electronic Engineering"
DOI: 10.15598/aeee.v15i2.2024
Abstract: In the paper the technological factors influencing test structure gate length were described. The influence of test structure gate placement (Schottky metallization between ohmic contacts, on mesa and on GaN surface) was analyzed and discussed.…
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Keywords:
gate fabrication;
gate;
effect gate;
test ... See more keywords