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Published in 2025 at "IEEE Journal of the Electron Devices Society"
DOI: 10.1109/jeds.2025.3584809
Abstract: In this study, AlGaN/GaN high-electron-mobility-transistor (HEMTs) with a small gate length were fabricated using a stepper. Additionally, a novel gate fabrication process was conducted to shrink the gate head, thus reducing the parasitic capacitance of…
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Keywords:
gate fabrication;
inline formula;
novel gate;
tex math ... See more keywords
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Published in 2017 at "Advances in Electrical and Electronic Engineering"
DOI: 10.15598/aeee.v15i2.2024
Abstract: In the paper the technological factors influencing test structure gate length were described. The influence of test structure gate placement (Schottky metallization between ohmic contacts, on mesa and on GaN surface) was analyzed and discussed.…
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Keywords:
gate fabrication;
gate;
effect gate;
test ... See more keywords