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Published in 2017 at "IEEE Electron Device Letters"
DOI: 10.1109/led.2017.2751418
Abstract: For the first time, the influence of fast pulse induced skin effect on the current distribution inside the grounded-gate NMOS (GGNMOS) is reported. The skin effect results in the current crowding at the finger edges…
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Keywords:
grounded gate;
effect;
skin effect;
gate nmos ... See more keywords