Development of gallium-arsenide-based GCPW calibration kits for on-wafer measurements in the W-band
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DOI: 10.1017/s1759078719001521
Abstract: Abstract We present details of on-wafer-level 16-term error model calibration kits used for the characterization of W-band circuits based on a grounded coplanar waveguide (GCPW). These circuits were fabricated on a thin gallium arsenide (GaAs)… read more here.
Keywords: calibration; gallium arsenide; measurements band; wafer measurements ... See more keywords