Identification and Molecular Marker Detection of Leaf Rust Resistance Genes in Wheat Lines from China: Development of an Efficient Software for Gene Postulation.
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DOI: 10.1094/phyto-08-24-0249-r
Abstract: Wheat leaf rust, caused by Puccinia triticina Erikss. (Pt), is one of the most devastating diseases in common wheat (Triticum aestivum L.) globally. Using resistant lines is the most cost-effective and safe disease control method.… read more here.
Keywords: gene postulation; resistance; wheat lines; gene ... See more keywords