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Published in 2020 at "ACS nano"
DOI: 10.1021/acsnano.9b08986
Abstract: One of the major problems with phase change memory (PCM) is the high current density required for the crystal-amorphous transformation via a melt-quench process. However, alternative low-energy pathways of amorphization via a defect-assisted process have…
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Keywords:
phase change;
gete nanowires;
carrier;
carrier localization ... See more keywords