Ion beam analysis of silver leaves in gilt leather wall coverings.
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DOI: 10.1016/j.talanta.2019.120191
Abstract: An analytical methodology involving Particle Induced X-ray Emission (PIXE) and Rutherford Backscattering Spectroscopy (RBS) was implemented to respectively characterize the composition and the thickness of silver leaves on gilt leather decors. These objects, ancestors of… read more here.
Keywords: gilt leather; methodology; leaves gilt; silver leaves ... See more keywords