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Published in 2024 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"
DOI: 10.1109/tcad.2023.3336212
Abstract: The pursuit of accurate diagnosis with good resolution is driven by yield learning during both early bring-up and production excursions. Unfortunately, fault callouts from diagnosis tools often render poor resolution that hinders the follow-up failure…
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Keywords:
diagnosis;
graph neural;
framework improved;
grand graph ... See more keywords