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Published in 2019 at "JOM"
DOI: 10.1007/s11837-019-03826-9
Abstract: Fatigue crack growth in Ti-6Al-4V has been explored through the combined use of high-energy x-ray diffraction (HEXD) analysis, electron backscatter diffraction analysis, and fractography to draw a connection between the driving forces and micromechanisms of…
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Keywords:
fatigue crack;
diffraction;
growth 6al;
crack ... See more keywords