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Published in 2019 at "Semiconductor Science and Technology"
DOI: 10.1088/1361-6641/aacf38
Abstract: High quality AlAs1-xBix layers with Bi composition of 3%-10.5% have been successfully grown by molecular beam epitaxy. The Bi incorporation is confirmed by Rutherford backscattering spectroscopy. For a 400 nm thick AlAsBi layer, the strain…
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Keywords:
molecular beam;
growth alas1;
epitaxy growth;
beam epitaxy ... See more keywords