Three-dimensional analysis of Eu dopant atoms in Ca-α-SiAlON via through-focus HAADF-STEM imaging.
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DOI: 10.1016/j.ultramic.2017.01.014
Abstract: Three-dimensional (3D) distributional analysis of individual dopant atoms in materials is important to development of optical, electronic, and magnetic materials. In this study, we adopted through-focus high-angle annular dark-field (HAADF) imaging for 3D distributional analysis… read more here.
Keywords: three dimensional; haadf; dopant atoms; dopant ... See more keywords