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Published in 2017 at "IEEE Transactions on Device and Materials Reliability"
DOI: 10.1109/tdmr.2017.2665780
Abstract: This paper presents a Schmitt trigger (ST) buffer using carbon nanotube FET (CNTFET) for reliable low-power applications. Nanoscale circuits are more susceptible to transient faults or soft errors due to the reduction of the stored…
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Keywords:
hardened latch;
cntfet;
schmitt trigger;
technology ... See more keywords