Dynamic heavy ions SEE testing of NanoXplore radiation hardened SRAM-based FPGA: Reliability-performance analysis
Sign Up to like & getrecommendations! Published in 2019 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2019.113437
Abstract: Abstract NanoXplore is the European pioneer vendor to develop ITAR-free radiation-hardened SRAM-based FPGAs. This work is the first to explore dynamic SEE tests in the NG-Medium FPGA device. The reliability-performance analysis of an embedded unmitigated… read more here.
Keywords: radiation hardened; hardened sram; sram based; performance ... See more keywords
Nwise and Pwise: 10T Radiation Hardened SRAM Cells for Space Applications with High Reliability Requirements
Sign Up to like & getrecommendations! Published in 2022 at "IEEE Access"
DOI: 10.1109/access.2022.3157402
Abstract: SRAM cells are widely used to design memory blocks of, e.g., caches, register files, and translation lookaside buffers. Depending on the SRAM application, the design requirements are different. For instance, in space applications, alongside energy… read more here.
Keywords: cell; space; radiation hardened; space applications ... See more keywords