Investigation of interface trap charges and temperature variation in heterostacked-TFET
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DOI: 10.1007/s12648-020-01834-z
Abstract: This paper analyzes the reliability issues of the Heterostacked-TFET (HS-TFET) in detail. The investigation of the device reliability is carried out by examining the effect of interface trap charges (ITCs) and the temperature affectability of… read more here.
Keywords: heterostacked tfet; variation; interface trap; trap ... See more keywords