Far-infrared optical properties of Hg1−Cd Se thin films
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DOI: 10.1016/j.ssc.2019.113729
Abstract: Abstract Using a combination of reflectivity and ellipsometry, we determined the far-infrared dielectric functions of molecular beam epitaxy-grown Hg1−xCdxSe thin films between 85 cm−1 and 8, 000 cm−1. Spectroscopic ellipsometry, performed between 400 cm−1 and 8000 cm−1, recovered the… read more here.
Keywords: thin films; optical properties; properties hg1; far infrared ... See more keywords