Equiprobability-Based Local Response Surface Method for High-Sigma Yield Estimation With Both High Accuracy and Efficiency
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DOI: 10.1109/tcad.2022.3193875
Abstract: With the ever-increasing transistor density and memory capability in integrated circuits, the high-sigma yield estimation has become a growing concern. This work presents an equiprobability-based local response surface (ELRS) method that can perform a high-sigma… read more here.
Keywords: method; yield estimation; sigma yield; high sigma ... See more keywords