Amplitude modulation atomic force microscopy based on higher flexural modes
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DOI: 10.1063/1.5004732
Abstract: In this work, amplitude modulation atomic force microscopy (AM-AFM) based on the higher flexural modes of the microcantilever is investigated by a numerical approach. The amplitude-distance and phase-distance curves for the first four flexural modes… read more here.
Keywords: microscopy; higher flexural; flexural modes; force ... See more keywords