Hit and Indexing Rate in Serial Crystallography: Incomparable Statistics
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DOI: 10.3389/fmolb.2022.858815
Abstract: Serial crystallography (SX) using X-ray free-electron lasers (XFEL) and synchrotron X-rays is an emerging X-ray crystallography technique to determine the structure of macromolecules at room temperature or near-physiological temperature with minimal radiation damage (Chapman et… read more here.
Keywords: chapman; crystallography; diffraction; hit images ... See more keywords