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Published in 2017 at "Journal of the Korean Physical Society"
DOI: 10.3938/jkps.71.275
Abstract: This paper explores the impacts of both the strained silicon layer thickness, D, and germanium mole fraction, X, on the electrical characteristics of a heterostructure junctionless (HJL)-FET by a numerical simulator. The gate controllability on…
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Keywords:
junctionless;
layer;
hjl;
hjl fet ... See more keywords