Hole generation associated with intrinsic defects in SOI-based SiGe thin films formed by solid-source molecular beam epitaxy
Sign Up to like & getrecommendations! Published in 2018 at "Journal of Applied Physics"
DOI: 10.1063/1.5004077
Abstract: The electronic properties of SiGe on insulator (SGOI) structure are under intense investigation due to its importance as an electronic material. In the previous investigations, a p-type conduction was observed in SGOI even in the… read more here.
Keywords: defects soi; intrinsic defects; generation associated; soi based ... See more keywords
Micro-Hole Generation by High-Energy Pulsed Bessel Beams in Different Transparent Materials
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DOI: 10.3390/mi12040455
Abstract: Micro-drilling transparent dielectric materials by using non-diffracting beams impinging orthogonally to the sample can be performed without scanning the beam position along the sample thickness. In this work, the laser micromachining process, based on the… read more here.
Keywords: pulsed bessel; different transparent; bessel beams; transparent materials ... See more keywords