Hole Trap Formation in Quantum Dot Light‐Emitting Diodes Under Electrical Stress
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DOI: 10.1002/aelm.202400231
Abstract: Quantum dot light‐emitting diodes (QLEDs) have emerged as promising candidates for next‐generation display technology, but the limited lifetime of QLEDs hampers their further commercialization. Despite extensive research that has been conducted for the last decades,… read more here.
Keywords: dot light; quantum dot; hole trap; formation ... See more keywords