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Published in 2021 at "Journal of Physical Chemistry C"
DOI: 10.1021/acs.jpcc.0c11289
Abstract: A deep understanding of hot carrier (HC) dynamics is important to improve the performance of optoelectronic devices by reducing the thermalization losses. Here, we investigate the hot hole cooling ...
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Keywords:
cooling transfer;
transfer dynamics;
hot hole;
hole cooling ... See more keywords
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Published in 2020 at "IEEE Transactions on Electron Devices"
DOI: 10.1109/ted.2020.3019982
Abstract: Fluctuating parametric shifts that arise from the stochastic capture/emission by oxide traps in small gate-area MOSFETs have triggered considerable interest due to their impact on timing-sensitive circuits. To date, studies have only reported the effect…
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Keywords:
impact channel;
emission;
chh stress;
stress ... See more keywords