Multifaceted impacts of reliability issues: trap dynamics, positive bias temperature instability, and effect of temperature on the HSSP-nTFET
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DOI: 10.1088/1361-6641/adb87c
Abstract: This study investigates the influence of interface trap charges (ITCs) on the performance parameters of the proposed lateral hetero-stacked source with pocket n-type tunneling field-effect transistor (HSSP-nTFET). The influence of different concentrations of donor and… read more here.
Keywords: temperature; hssp ntfet; effect; reliability ... See more keywords