Hard-to-Detect Fault Analysis in FinFET SRAMs
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DOI: 10.1109/tvlsi.2021.3071940
Abstract: Manufacturing defects can cause hard-to-detect (HTD) faults in fin field-effect transistor (FinFET) static random access memories (SRAMs). Detection of these faults, such as random read outputs and out-of-spec parametric deviations, is essential when testing FinFET… read more here.
Keywords: finfet srams; test; htd; htd faults ... See more keywords