Recent advances in hybrid measurement methods based on atomic force microscopy and surface sensitive measurement techniques
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DOI: 10.1039/c7ra08515j
Abstract: AFM was proposed in the 1990s as a tool to determine the topography at a sub-micrometer level. Since then AFM proved to be a valuable tool in material science and physical chemistry. Soon after successful… read more here.
Keywords: resolution; hybrid measurement; microscopy; spectroscopy ... See more keywords