Sign Up to like & get
recommendations!
1
Published in 2017 at "IEEE Transactions on Device and Materials Reliability"
DOI: 10.1109/tdmr.2016.2644721
Abstract: Very large-scale integrated circuit design, based on today’s CMOS technologies, are facing various challenges. Shrinking transistor dimensions, reduction in threshold voltage, and lowering power supply voltage, cause new concerns such as high leakage current, and…
read more here.
Keywords:
mtj cmos;
power;
hybrid mtj;
cmos based ... See more keywords