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Published in 2018 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927618001563
Abstract: It has recently been reported that the Integrated Differential Phase Contrast STEM (iDPC-STEM) technique [1, 2] enables imaging of both light and heavy atoms together in a thin sample at sub-Å resolution [3]. Furthermore it…
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Keywords:
resolution;
contrast;
simultaneous idpc;
adf stem ... See more keywords