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Published in 2019 at "Solid-State Electronics"
DOI: 10.1016/j.sse.2018.12.020
Abstract: Abstract The light-illumination stability of amorphous InGaZnO Thin Film Transistors (a-IGZO TFTs) in oxygen and moisture ambience was in-depth characterized by both current-voltage (I-V) and capacitance-voltage (C-V) measurements. With the illuminated light wavelength decreasing, both…
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Keywords:
amorphous ingazno;
illumination stability;
light illumination;
stability amorphous ... See more keywords