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Published in 2017 at "Philosophical Magazine"
DOI: 10.1080/14786435.2016.1262971
Abstract: Abstract Dislocations in shock loaded tantalum single crystals were imaged using both transmission electron microscope (TEM) and electron channelling contrast image (ECCI) in a scanning electron microscope with a conventional backscattered electron detector. The results…
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Keywords:
contrast imaging;
electron channelling;
contrast;
imaging dislocations ... See more keywords