LASIE: Large Area Spectroscopic Imaging Ellipsometry for Characterizing Multi-Layered Film Structures
Sign Up to like & getrecommendations! Published in 2018 at "International Journal of Precision Engineering and Manufacturing"
DOI: 10.1007/s12541-018-0133-9
Abstract: In this investigation, we describe a spectroscopic imaging ellipsometry for large area measurements, named as large area spectroscopic ellipsometry (LASIE). LASIE uses a broadband light source and an imaging spectrometer in order to obtain the… read more here.
Keywords: spectroscopic imaging; area; spectroscopic; film ... See more keywords
Spectroscopic imaging ellipsometry of self-assembled SiGe/Si nanostructures
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DOI: 10.1016/j.apsusc.2016.10.123
Abstract: Abstract Spectroscopic imaging ellipsometry is used to characterize films containing self-assembled SiGe/Si in-plane nanowires grown by molecular beam epitaxy on a Si(001) substrate. The spatial resolution of the order of ∼1 μm allows to study individual… read more here.
Keywords: ellipsometry; spectroscopic imaging; assembled sige; self assembled ... See more keywords
Spectroscopic imaging ellipsometry for automated search of flakes of mono- and n-layers of 2D-materials
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DOI: 10.1016/j.apsusc.2016.10.158
Abstract: Abstract Spectroscopic imaging ellipsometry (SIE) is used to localize and characterize flakes of conducting, semi-conducting and insulating 2D-materials. Although the research in the field of monolayers of 2D-materials increased the last years, it is still… read more here.
Keywords: spectroscopic imaging; ellipsometry automated; automated search; search flakes ... See more keywords
Measuring optical constants of ultrathin layers using surface-plasmon-resonance-based imaging ellipsometry.
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DOI: 10.1364/ao.56.007898
Abstract: A setup for surface-plasmon-resonance- (SPR) based imaging ellipsometry was developed, which gains from the sensitivities of both SPR and ellipsometry to ultrathin film parameters. It is based on Otto's configuration for prism-sample coupling and a… read more here.
Keywords: ellipsometry; optical constants; surface plasmon; plasmon resonance ... See more keywords
Microscopic imaging ellipsometry of submicron-scale bacterial cells
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DOI: 10.4314/tjpr.v16i11.20
Abstract: Purpose: To demonstrate the power of microscopic imaging ellipsometry (MIE) to identify submicronscale bacterial cells and track their surface topology variation. Methods: Microscopic imaging ellipsometry with rotating compensator configuration was used to measure the ellipsometric… read more here.
Keywords: bacterial cells; ellipsometry; microscopic imaging; submicron scale ... See more keywords