Surface characterization of low-temperature grown yttrium oxide
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DOI: 10.1016/j.apsusc.2017.12.121
Abstract: Abstract The step-by-step growth of yttrium oxide layer was controlled in situ using X-ray photoelectron spectroscopy (XPS). The O/Y atomic concentration (AC) ratio in the surface layer of finally oxidized Y substrate was found to… read more here.
Keywords: surface; yttrium oxide; imfps; spectroscopy ... See more keywords