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Published in 2019 at "Microelectronic Engineering"
DOI: 10.1016/j.mee.2019.01.003
Abstract: Abstract The influence of variations in the Si fin shape on the electrical properties of junctionless transistors (JLTs) was investigated through two-dimensional Poisson equation numerical simulations at different doping concentrations. Stronger gate coupling in a…
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Keywords:
impact fin;
doping concentrations;
channel doping;
junctionless transistors ... See more keywords