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Published in 2019 at "Semiconductors"
DOI: 10.1134/s1063782619110204
Abstract: The accumulation of structural damage in GaN under irradiation with accelerated F and Ne ions with energies of 1.3 and 3.2 keV/amu is investigated. It is shown that chemical effects during implantation of fluorine ions…
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Keywords:
implantation fluorine;
structural damage;
fluorine ions;
accumulation structural ... See more keywords