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Published in 2020 at "Ceramics International"
DOI: 10.1016/j.ceramint.2020.03.121
Abstract: Abstract The impact of Ta incorporation (up to ~21 at.%) in titanium dioxide (TiO2) films subjected to post-deposition millisecond-range flash-lamp annealing (FLA) is addressed. Phase formation with short-range information was established by means of soft X-ray…
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Keywords:
ray absorption;
ray;
flash lamp;
lamp annealing ... See more keywords