Detection of Defects in a Dielectric Material by Thermo-Elastic Optical Indicator Microscopy
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DOI: 10.1109/access.2023.3274534
Abstract: We present a new optical method for the detection of defect in dielectric materials. This method is based on the optical visualization of the microwave near-field distribution around defects in a dielectric material. In this… read more here.
Keywords: optical indicator; indicator microscopy; microscopy; defects dielectric ... See more keywords