Thin film metrology and microwave loss characterization of indium and aluminum/indium superconducting planar resonators
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DOI: 10.1063/1.5020514
Abstract: Scalable architectures characterized by quantum bits (qubits) with low error rates are essential to the development of a practical quantum computer. In the superconducting quantum computing implementation, understanding and minimizing materials losses is crucial to… read more here.
Keywords: indium; microwave loss; indium aluminum; metrology ... See more keywords