Thermo-mechanically induced texture evolution and micro-structural change of aluminum metallization
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DOI: 10.1007/s10854-017-8328-x
Abstract: During operation of high power electronic chips the topside metallization is subjected to cyclic compressive and tensile stresses leading to unwanted thermo-mechanical fatigue of the metallization layer. The stress is caused by the difference in… read more here.
Keywords: thermo mechanically; evolution; induced texture; texture ... See more keywords