Electron inducing soft errors in 28 nm system-on-Chip
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DOI: 10.1080/10420150.2020.1759067
Abstract: ABSTRACT The 28 nm system-on-chip (SoC) was irradiated by 12 MeV electron at the China Institute of Atomic Energy (CIAE) for the first time. Soft errors in the on-chip memory (OCM), D-Cache, Register and BRAM blocks were… read more here.
Keywords: inducing soft; electron inducing; soft errors; system chip ... See more keywords