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Published in 2022 at "IEEE Transactions on Instrumentation and Measurement"
DOI: 10.1109/tim.2022.3196436
Abstract: Currently, deep learning-based visual inspection has been highly successful with the help of supervised learning methods. However, in real industrial scenarios, the scarcity of defect samples, the cost of annotation, and the lack of $a$…
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Keywords:
localization;
industrial images;
anomaly localization;
unsupervised anomaly ... See more keywords