Articles with "infant failure" as a keyword



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Modeling and detecting approach for the change point of electronic product infant failure rate

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Published in 2019 at "Microelectronics Reliability"

DOI: 10.1016/j.microrel.2019.06.031

Abstract: Abstract Infant failures are the natural enemy of customer satisfaction of electronic product. The change point is a precondition to optimize the burn-in time, warranty period, and root causes in production reliability assurance. However, the… read more here.

Keywords: failure rate; change; change point; infant failure ... See more keywords