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Published in 2020 at "Semiconductors"
DOI: 10.1134/s1063782620080229
Abstract: The process of the Pd-assisted etching of silicon in a solution containing HF and H2O2 is investigated. It is shown that the morphology of the forming layers is affected by such factors as the etching…
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Keywords:
temperature;
formation temperature;
assisted etching;
morphology ... See more keywords