Mid-infrared characterization and modelling of transparent conductive oxides
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DOI: 10.1016/j.solener.2020.09.020
Abstract: Abstract Mid-infrared spectroscopic characterization of doped layers is a rapid, contactless and non-destructive method of determining doped semiconductor layer properties, being used as an inline monitoring tool in industrial environments. Extending this technique to transparent… read more here.
Keywords: characterization modelling; characterization; mid infrared; transparent conductive ... See more keywords