Tailoring optical and resistance properties of the functional CuAlxOy semiconductor for applications as thermal infrared imagers
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DOI: 10.1016/j.jsamd.2021.01.004
Abstract: Abstract This is the first report on the optical and resistance properties of copper aluminum oxide thin films for applications as thermal infrared imagers. The deposition of these films was investigated under three series of… read more here.
Keywords: resistance properties; infrared imagers; optical resistance; resistance ... See more keywords