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Published in 2018 at "ACS applied materials & interfaces"
DOI: 10.1021/acsami.8b02678
Abstract: In this study, the properties of indium oxynitride (InON) semiconductor films grown by reactive radio frequency sputtering were examined both experimentally and theoretically. Also, thin-film transistors (TFTs) incorporating InON as the active layer were evaluated…
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Keywords:
based indium;
inon;
semiconductor;
thin film ... See more keywords