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Published in 2017 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2017.01.027
Abstract: Abstract The optical properties of an epitaxial indium phosphide (InP) film deposited on an Fe compensated InP (InP:Fe) wafer have been measured at room temperature by ex-situ spectroscopic ellipsometry over a spectral range of 0.038–8.5 eV.…
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Keywords:
properties inp;
optical properties;
inp infrared;
spectroscopic ellipsometry ... See more keywords