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Published in 2023 at "Journal of Semiconductors"
DOI: 10.1088/1674-4926/44/4/044102
Abstract: The temperature characteristics of the read current of the NOR embedded flash memory with a 1.5T-per-cell structure are theoretically analyzed and experimentally verified. We verify that for a cell programmed with a “10” state, the…
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Keywords:
cell;
flash memory;
insensitive reading;
temperature ... See more keywords